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Pattern language
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#	Item
171	Identifying Web Tables – Supporting a Neglected Type of Content on the Web Mikhail Galkin Dmitry Mouromtsev Add to Reading List Source URL: arxiv.org Language: English - Date: 2015-03-23 20:53:18 Formal sciences Knowledge Computational linguistics String metric Information extraction Pattern recognition Ontology learning Data mining Weka Science Natural language processing Artificial intelligence
172	A Logical Geo-Ontology Design Pattern for Quantifying over Types David Carral Martínez Krzysztof Janowicz Add to Reading List Source URL: geog.ucsb.edu Language: English - Date: 2012-09-22 13:20:34 Information science Semantic Web Technical communication Knowledge Knowledge representation Description logic Web Ontology Language Upper ontology Cyc Ontology Information Science
173	R o l e s a nd C l a ss es i n O b j e ct O r i e n t e d Pr o g ra m m i n g Trygve Reenskaug University of Oslo Department of informatics PO box 1080 Blindern, 0316 Oslo, Norway. Add to Reading List Source URL: heim.ifi.uio.no Language: English - Date: 2007-10-12 11:45:28 Computer programming Unified Modeling Language Object Oriented Role Analysis and Modeling Software design pattern Object-oriented design Object Inheritance Association Design Patterns Software engineering Object-oriented programming Computing
174	OPEN MIND SPEECH RECOGNITION Jean-Marc Valin Universit´e de Sherbrooke 2500 boulevard de l’Universit´e Sherbrooke, Qu´ebec J1K 2R1 CANADA Add to Reading List Source URL: jmvalin.ca Language: English - Date: 2004-09-22 11:36:53 Formal sciences Speech recognition Artificial intelligence Computational neuroscience Computer accessibility Machine learning Natural language processing Pattern recognition Open source Computational linguistics Science Knowledge
175	Cross-Document Pattern Matching Gregory Kucherov1 1 Universit´ e Yakov Nekrich2 Add to Reading List Source URL: www.cs.ucr.edu Language: English - Date: 2012-12-29 15:22:50 Unified Modeling Language Dynamic systems development method Use case Alistair Cockburn Agile software development RIS Object-oriented analysis and design Leszek Maciaszek Software development Software project management Software
176	DOC Document Add to Reading List Source URL: www.cs.rice.edu Language: English - Date: 2015-05-02 11:06:22 Actor model Concurrent computing Programming language Java Object-oriented programming Domain-specific language Software design pattern Scala Software development methodology Computing Software engineering Computer programming
177	CPMPrefix-Free Regular-Expression Matching Yo-Sub Han∗ , Yajun Wang and Derick Wood Department of Computer Science Add to Reading List Source URL: www.cs.ucr.edu Language: English - Date: 2005-07-08 16:23:53 Theoretical computer science Combinatorics Pattern matching Regular expression Matching Substring String Regular language Approximate string matching Formal languages Automata theory Mathematics
178	OMeta: an Object-Oriented Language for Pattern Matching ∗ Alessandro Warth Ian Piumarta Computer Science Department Add to Reading List Source URL: tinlizzie.org Language: English - Date: 2008-12-30 02:04:39 Computing Programming language implementation Syntactic predicate Parsing expression grammar LL parser Viewpoints Research Institute Scannerless parsing Compiler-compiler COLA Formal languages Software engineering Parsing
179	SPIED: Stanford Pattern-based Information Extraction and Diagnostics Sonal Gupta Christopher D. Manning Department of Computer Science Stanford University {sonal, manning}@cs.stanford.edu Add to Reading List Source URL: nlp.stanford.edu Language: English - Date: 2014-06-26 22:01:01 Natural language processing Data analysis Data mining Formal sciences Information extraction Entity-relationship model Machine learning Biomedical text mining Named-entity recognition Science Computational linguistics Knowledge
180	onTAP Interconnect Test Product Description Interconnect Test Interconnect tests are a key function of any boundary scan test program. The onTAPInterconnect Test performs the 3 essential functions of boundary scan: 1. C Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:18 Electronic engineering Boundary scan Joint Test Action Group Serial Vector Format Resistor Automatic test pattern generation Boundary scan description language Electronics manufacturing Manufacturing Electronics

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